X‐ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth
Hong, Hawoong, Aburano, R. D., Chung, Ki‐Sup, Lin, D.‐S., Hirschorn, E. S., Chiang, T.‐C., Chen, HaydnVolume:
79
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.361507
Date:
May, 1996
File:
PDF, 605 KB
english, 1996