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The microstructure and electrical transport properties of immiscible copper-niobium alloy thin films
Banerjee, Rajarshi, Bose, Sangita, Genc, Arda, Ayyub, PushanVolume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2836970
File:
PDF, 963 KB
english, 2008