Influence of acceptor-like traps in the buffer on current...

Semiconductor Science and Technology 2013 / 11 Vol. 28; Iss. 11

Influence of acceptor-like traps in the buffer on current collapse and leakage of E-mode AlGaN/GaN MISHFETs

Tang, Chenjie, Shi, Junxia
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Volume:
28
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/28/11/115011
Date:
November, 2013
File:
PDF, 2.03 MB
english, 2013
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