An Adaptive Analog Circuit for LVDT’s Nanometer Measurement Without Losing Sensitivity and Range
Chen, Gang, Zhang, Bo, Liu, Pinkuan, Ding, HanVolume:
15
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2014.2364610
Date:
April, 2015
File:
PDF, 604 KB
english, 2015