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Observation of rapid direct charge transfer between deep...

Physical Review Letters 1994 / 5 Vol. 72; Iss. 18

Observation of rapid direct charge transfer between deep defects in silicon

Frens, A. M., Bennebroek, M. T., Zakrzewski, A., Schmidt, J., Chen, W. M., Janzén, E., Lindström, J. L., Monemar, B.
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Volume:
72
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.72.2939
Date:
May, 1994
File:
PDF, 305 KB
english, 1994
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