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High precision measurement of undulator polarization in the regime of hard x-rays
Marx, B., Schulze, K. S., Uschmann, I., Kämpfer, T., Wehrhan, O., Wille, H. C., Schlage, K., Röhlsberger, R., Weckert, E., Förster, E., Stöhlker, T., Paulus, G. G.Volume:
105
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4890584
Date:
July, 2014
File:
PDF, 767 KB
english, 2014