In situ imaging of threading dislocation...

In situ imaging of threading dislocation terminations at the surface of GaN(0001) epitaxially grown on Si(111)

Vézian, S., Massies, J., Semond, F., Grandjean, N., Vennéguès, P.
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Volume:
61
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.61.7618
Date:
March, 2000
File:
PDF, 580 KB
english, 2000
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