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[IEEE 2009 International Conference on Software Testing, Verification, and Validation Workshops - Denver, CO, USA (2009.04.1-2009.04.4)] 2009 International Conference on Software Testing, Verification, and Validation Workshops - Mutation Analysis of Parameterized Unit Tests
Xie, Tao, Tillmann, Nikolai, de Halleux, Jonathan, Schulte, WolframYear:
2009
Language:
english
DOI:
10.1109/icstw.2009.43
File:
PDF, 167 KB
english, 2009