Trapping of carriers in single quantum wells with different configurations of the confinement layers
Polland, H.-J., Leo, K., Rother, K., Ploog, K., Feldmann, J., Peter, G., Göbel, E. O., Fujiwara, K., Nakayama, T., Ohta, Y.Volume:
38
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.38.7635
Date:
October, 1988
File:
PDF, 707 KB
english, 1988