Diffuse-x-ray-scattering measurements of roughness on...

Physical Review B 1995 / 2 Vol. 51; Iss. 8

Diffuse-x-ray-scattering measurements of roughness on ion-etched multilayer interfaces

Schlatmann, R., Shindler, J. D., Verhoeven, J.
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Volume:
51
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.51.5345
Date:
February, 1995
File:
PDF, 310 KB
english, 1995
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