Calibration of a single-atom detector for atomic microchips

Calibration of a single-atom detector for atomic microchips

Stibor, A., Kraft, S., Campey, T., Komma, D., Günther, A., Fortágh, J., Vale, C. J., Rubinsztein-Dunlop, H., Zimmermann, C.
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Volume:
76
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.76.033614
Date:
September, 2007
File:
PDF, 259 KB
english, 2007
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