/Si(111): Thin-film characterization by high-resolution...

Physical Review B 1986 / 11 Vol. 34; Iss. 10

/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopy

Liehr, M., Thiry, P. A., Pireaux, J. J., Caudano, R.
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Volume:
34
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.34.7471
Date:
November, 1986
File:
PDF, 310 KB
english, 1986
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