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Experimental verification of prediction method for electromigration failure of polycrystalline lines
Sasagawa, Kazuhiko, Naito, Kazushi, Kimura, Hiroki, Saka, Masumi, Abé, HiroyukiVolume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.372257
File:
PDF, 937 KB
english, 2000