Simulation of electromigration effects on voids in...

Physical Review B 2012 / 1 Vol. 85; Iss. 3

Simulation of electromigration effects on voids in monocrystalline Ag films

Latz, A., Sindermann, S., Brendel, L., Dumpich, G., Meyer zu Heringdorf, F.-J., Wolf, D. E.
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Volume:
85
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.85.035449
Date:
January, 2012
File:
PDF, 719 KB
english, 2012
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