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High-resolution electron microscopy study of tunnelling junctions with AlN and AlON barriers
Shang, Ping, Petford-Long, Amanda K., Nickel, Janice H., Sharma, Manish, Anthony, Thomas C.Volume:
89
Year:
2001
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1357835
File:
PDF, 666 KB
english, 2001