Fracture characterization in patterned thin films by cross-sectional nanoindentation
I. Ocaña, J.M. Molina-Aldareguia, D. Gonzalez, M.R. Elizalde, J.M. Sánchez, J.M. Martínez-Esnaola, J. Gil Sevillano, T. Scherban, D. Pantuso, B. Sun, G. Xu, B. Miner, J. He, J. MaizVolume:
54
Year:
2006
Language:
english
Pages:
10
DOI:
10.1016/j.actamat.2006.03.027
File:
PDF, 1.07 MB
english, 2006