[IEEE 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013 - Seattle, WA, USA (2013.06.2-2013.06.7)] 2013 IEEE MTT-S International Microwave Symposium Digest (MTT) - Dynamic measurement of permittivity and permeability using ferrite loaded cavity
Nikawa, Yoshio, Nakamura, SuguruYear:
2013
Language:
english
DOI:
10.1109/mwsym.2013.6697666
File:
PDF, 298 KB
english, 2013