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Shallow and deep impurity levels in multivalley semiconductors: A Green-function study of silicon by the recursion method
Lohrmann, Dieter J., Resca, Lorenzo, Parravicini, Giuseppe Pastori, Graft, Ronald D.Volume:
40
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.40.8410
Date:
October, 1989
File:
PDF, 409 KB
english, 1989