capacitors: Possible influence of defect structure on...

Physical Review B 2003 / 7 Vol. 68; Iss. 1

capacitors: Possible influence of defect structure on fatigue properties

Chu, M.-W., Ganne, M., Caldes, M. T., Gautier, E., Brohan, L.
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Volume:
68
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.68.014102
Date:
July, 2003
File:
PDF, 521 KB
english, 2003
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