Thickness and annealing temperature dependences of...

Journal of Applied Physics 2009 Vol. 105; Iss. 10

Thickness and annealing temperature dependences of magnetization reversal and domain structures in exchange biased Co/Ir–Mn bilayers

Gornakov, V. S., Tikhomirov, O. A., Lee, C. G., Jung, J. G., Egelhoff, W. F.
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Volume:
105
Year:
2009
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3130411
File:
PDF, 1.14 MB
english, 2009
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