Nanoscale and submicron fatigue crack growth in nickel microbeams
Y. Yang, N. Yao, B. Imasogie, W.O. SoboyejoVolume:
55
Year:
2007
Language:
english
Pages:
11
DOI:
10.1016/j.actamat.2007.03.027
File:
PDF, 2.43 MB
english, 2007