![](/img/cover-not-exists.png)
[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - An automated approach to isolate dominant SER susceptibilities in microcircuits
Castillo, James, Mavis, David, Eaton, Paul, Sibley, Mike, Elkins, Don, Floyd, RichYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784595
File:
PDF, 897 KB
english, 2011