![](/img/cover-not-exists.png)
[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Study of the SEU Effect Mechanism on SOI PMOS by 2-D Simulation
Zhao, Fa-zhan, Guo, Tian-lei, Hai, Chao-he, Liu, Meng-xinYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306156
File:
PDF, 134 KB
english, 2006