Characterizing the rate and coherence of single-electron tunneling between two dangling bonds on the surface of silicon
Shaterzadeh-Yazdi, Zahra, Livadaru, Lucian, Taucer, Marco, Mutus, Josh, Pitters, Jason, Wolkow, Robert A., Sanders, Barry C.Volume:
89
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.89.035315
Date:
January, 2014
File:
PDF, 1.32 MB
english, 2014