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Core-state manipulation of single Fe impurities in GaAs with a scanning tunneling microscope
Bocquel, J., Kortan, V. R., Şahin, C., Campion, R. P., Gallagher, B. L., Flatté, M. E., Koenraad, P. M.Volume:
87
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.87.075421
Date:
February, 2013
File:
PDF, 3.01 MB
english, 2013