Investigation of head wear and contamination in helical...

IEEE Transactions on Magnetics 1996 / Sept. Vol. 32; Iss. 5

Investigation of head wear and contamination in helical scan tape systems

Sookyung Kim,, Prabhakaran, V., Talke, F.E.
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Volume:
32
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.538822
Date:
January, 1996
File:
PDF, 390 KB
english, 1996
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