Berreman effect applied to phase characterization of thin...

Physical Review B 2001 / 9 Vol. 64; Iss. 12

Berreman effect applied to phase characterization of thin films supported on metallic substrates: The case of

Trasferetti, B. C., Davanzo, C. U., Zoppi, R. A., da Cruz, N. C., de Moraes, M. A. B.
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Volume:
64
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.64.125404
Date:
September, 2001
File:
PDF, 498 KB
english, 2001
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