[IEEE 2008 Second IEEE International Conference on Secure System Integration and Reliability Improvement (SSIRI) - Yokohama, Japan (2008.07.14-2008.07.17)] 2008 Second International Conference on Secure System Integration and Reliability Improvement - Strategic Usage of Test Case Generation by Combining Two Test Case Generation Approaches
Nakao, Haruka, Eschbach, RobertYear:
2008
Language:
english
DOI:
10.1109/ssiri.2008.17
File:
PDF, 253 KB
english, 2008