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Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface
S. Shim, H. Bei, M.K. Miller, G.M. Pharr, E.P. GeorgeVolume:
57
Year:
2009
Language:
english
Pages:
8
DOI:
10.1016/j.actamat.2008.09.033
File:
PDF, 916 KB
english, 2009