![](/img/cover-not-exists.png)
[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - TDDB in the presence of interface states: Implications for the PMOS reliability margin
Nigam, T., Peumans, P.Year:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796814
File:
PDF, 602 KB
english, 2008