40-GHz/150-ns versatile pulsed measurement system for...

40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization

Teyssier, J.-P., Bouysse, P., Ouarch, Z., Barataud, D., Peyretaillade, T., Quere, R.
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Volume:
46
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/22.739281
Date:
January, 1998
File:
PDF, 235 KB
english, 1998
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