Effects of grain size and grain boundaries on defect production in nanocrystalline 3C–SiC
N. Swaminathan, Paul J. Kamenski, Dane Morgan, Izabela SzlufarskaVolume:
58
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.actamat.2010.01.009
File:
PDF, 554 KB
english, 2010