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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Anomalous low temperature charge leakage mechanism in ULSI flash memories
Lam, C., Sunaga, T., Igarashi, Y., Ichinose, M., Kitamura, K., Willets, C., Johnson, J., Mittl, S., White, F., Tang, H., Chen, T.-C.Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904324
File:
PDF, 690 KB
english, 2000