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A microcontroller-based system for piezoscanner nonlinearity correction: Atomic force microscope
Cidade, Geraldo Antônio Guerrera, Weissmüller, Gilberto, Bisch, Paulo MascarelloVolume:
69
Year:
1998
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1149144
File:
PDF, 3.71 MB
english, 1998