Dynamic force microscopy of copper surfaces: Atomic...

Physical Review B 2000 / 12 Vol. 62; Iss. 24

Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

Loppacher, Ch., Bammerlin, M., Guggisberg, M., Schär, S., Bennewitz, R., Baratoff, A., Meyer, E., Güntherodt, H.-J.
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Volume:
62
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.62.16944
Date:
December, 2000
File:
PDF, 708 KB
english, 2000
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