Electrical reliability of tunneling magnetoresistive read...

Electrical reliability of tunneling magnetoresistive read heads

Bae, Seongtae, Judy, Jack H., Tsu, I-Fei, Davis, Marshall
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Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1627948
File:
PDF, 704 KB
english, 2003
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