X-ray diffractometric characterization of the GaAsP/GaAs and InGaAs/GaAsP superlattices grown on offcut GaAs(001) substrate by means of the reciprocal space mapping
Gaca, J., Wojcik, M.Volume:
65
Year:
1994
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.112167
File:
PDF, 612 KB
english, 1994