Bonding characteristics of the √3°√3 Ag/Si interface...

Physical Review B 1987 / 2 Vol. 35; Iss. 6

Bonding characteristics of the √3°√3 Ag/Si interface identified by the energy dependence of the photoionization cross section

Yeh, J.-J., Bertness, K. A., Cao, R., Hwang, J., Lindau, I.
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Volume:
35
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.35.3024
Date:
February, 1987
File:
PDF, 196 KB
english, 1987
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