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[IEEE 2009 International SoC Design Conference (ISOCC) - Busan, Korea (South) (2009.11.22-2009.11.24)] 2009 International SoC Design Conference (ISOCC) - DFT for achieving hybrid transiton delay fault test with Reduced Pin Count Testing
Son, Changwon, Ahn, Seongyong, Kang, SunghoYear:
2009
Language:
english
DOI:
10.1109/socdc.2009.5423888
File:
PDF, 227 KB
english, 2009