![](/img/cover-not-exists.png)
Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures
Gurioli, M., Zamfirescu, M., Vinattieri, A., Sanguinetti, S., Grilli, E., Guzzi, M., Mazzucato, S., Polimeni, A., Capizzi, M., Seravalli, L., Frigeri, P., Franchi, S.Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2358397
File:
PDF, 314 KB
english, 2006