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-Ge films studied using spectroscopic ellipsometry
Yang, B., Pilione, L. J., Yehoda, J. E., Vedam, K., Messier, R.Volume:
36
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.36.6206
Date:
October, 1987
File:
PDF, 532 KB
english, 1987