Determination of critical current density and transition temperature of YBa2 Cu3 O7−x thin films by measurement of ac susceptibility
Li, Yi-Qun, Noh, Dongwook, Gallois, Bernard, Tompa, Gary S., Norris, Peter E., Zawadzki, Peter A.Volume:
68
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.346302
File:
PDF, 535 KB
english, 1990