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On Extra Delays Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiation
Tazi, Fatima Zahra, Thibeault, Claude, Savaria, Yvon, Pichette, Simon, Audet, YvesVolume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2369417
Date:
December, 2014
File:
PDF, 957 KB
english, 2014