layers on Si(111): Partially correlated roughness and...

Physical Review B 1996 / 1 Vol. 53; Iss. 3

layers on Si(111): Partially correlated roughness and diffuse x-ray scattering

Stettner, J., Schwalowsky, L., Seeck, O. H., Tolan, M., Press, W., Schwarz, C., Känel, H. v.
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Volume:
53
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.53.1398
Date:
January, 1996
File:
PDF, 675 KB
english, 1996
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