Noncontact inspection laser system for characterization of...

Noncontact inspection laser system for characterization of piezoelectric samples

Jiménez, F. J., De Frutos, J.
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Volume:
75
Year:
2004
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1794871
File:
PDF, 1.54 MB
english, 2004
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