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Structure-film thickness relationship study of sputtered NiO∕Ni bilayers using depth profiling and atomic force microscopy techniques
Abbey, Brian, Lipp, John D., Barber, Zoe H., Rayment, TrevorVolume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2205556
File:
PDF, 941 KB
english, 2006