[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Comparative analysis of SRAM memories used as PUF primitives
Schrijen, G-J, van der Leest, VincentYear:
2012
Language:
english
DOI:
10.1109/date.2012.6176696
File:
PDF, 209 KB
english, 2012