[IEEE International Electron Devices Meeting. Technical...

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[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - High performance 0.1 μm PD SOI tunneling-biased MOSFETs (TBMOS)

Kuo-Nan Yang,, Yi-Lin Chan,, Yu-Lin Chu,, Hou-Yu Chen,, Fu-Liang Yang,, Chenming Hu,
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Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979668
File:
PDF, 274 KB
english, 2001
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