One-Port De-Embedding Technique for the Quasi-Optical Characterization of Integrated Components
Hadjiloucas, Sillas, Walker, Gillian C., Bowen, John W.Volume:
13
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2012.2226713
Date:
January, 2013
File:
PDF, 1.38 MB
english, 2013