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[IEEE Comput. Soc Meeting on Design Automation and Test in Europe - Paris, France (27-30 March 2000)] Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) - An on chip ADC test structure
Yun-Che Wen,, Kuen-Jong Lee,Year:
2000
Language:
english
DOI:
10.1109/date.2000.840042
File:
PDF, 101 KB
english, 2000